Granted Patent
Utility
US 6,300,628 · App. 09/207,823
Focused ion beam machining method and device thereof
Inventors:
Toshiaki Fujii, Yasuhiko Sugiyama, Toshio Doi
Patented Case
View Patent ↗
Granted: Oct 9, 2001
Filed: Dec 9, 1998
Inventors
Toshiaki Fujii
Yasuhiko Sugiyama
Toshio Doi
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.