Granted Patent
Utility
US 6,301,690 · App. 09/294,495
Method to improve integrated circuit defect limited yield
Inventors:
Gary S. Ditlow, Daria R. Dooling, David E. Moran, Richard L. Moore, Gustavo E. Tellez, Ralph J. Williams, Thomas Wood Wilkins
Patented Case
View Patent ↗
Granted: Oct 9, 2001
Filed: Jul 12, 1999
Inventors
Gary S. Ditlow
Daria R. Dooling
David E. Moran
Richard L. Moore
Gustavo E. Tellez
Ralph J. Williams
Thomas Wood Wilkins
Assignee (at issue)
International Business Machines Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.