Granted Patent
Utility
US 6,310,684 · App. 09/552,306
Method of measuring spherical aberration in projection system
Inventor:
Seiji Matsuura
Patented Case
View Patent ↗
Granted: Oct 30, 2001
Filed: Apr 19, 2000
Inventor
Seiji Matsuura
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.