Granted Patent
Utility
US 6,313,655 · App. 09/133,893
Semiconductor component and method for testing and operating a semiconductor component
Inventor:
Gunnar Krause
Patented Case
View Patent ↗
Granted: Nov 6, 2001
Filed: Aug 14, 1998
Inventor
Gunnar Krause
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.