Granted Patent
Utility
US 6,323,671 · App. 09/291,309
Charge gain stress test circuit for nonvolatile memory and test method using the same
Inventor:
Kyeong-Man Ra
Patented Case
View Patent ↗
Granted: Nov 27, 2001
Filed: Apr 15, 1999
Inventor
Kyeong-Man Ra
Assignee (at issue)
Hyundai Electronics Industries Co. Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.