Granted Patent
Utility
US 6,324,486 · App. 09/259,609
Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time
Inventors:
David T. Crook, Steven K List, Stephen P. Rozum, Eddie Williamson
Patented Case
View Patent ↗
Granted: Nov 27, 2001
Filed: Mar 1, 1999
Inventors
David T. Crook
Steven K List
Stephen P. Rozum
Eddie Williamson
Assignee (at issue)
Agilent Technologies, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.