IP Library Granted Patent US 6,326,301
Granted Patent Utility
US 6,326,301 · App. 09/352,134

Method for forming a dual inlaid copper interconnect structure

Inventors: Suresh Venkatesan, Bradley P. Smith, Mohammed Rabiul Islam
Patented Case View Patent ↗
Granted: Dec 4, 2001 Filed: Jul 13, 1999
Inventors
Suresh Venkatesan
Bradley P. Smith
Mohammed Rabiul Islam
Assignee (at issue)
Motorola, Inc.

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Quick Facts
Patent No.
US 6,326,301
App. No.
09/352,134
Filed
1999-07-13
Granted
2001-12-04
Kind
A