Granted Patent
Utility
US 6,326,792 · App. 09/154,026
Method and apparatus for lifetime prediction of dielectric breakdown
Inventor:
Kenji Okada
Patented Case
View Patent ↗
Granted: Dec 4, 2001
Filed: Sep 16, 1998
Inventor
Kenji Okada
Assignee (at issue)
Matsushita Electronics Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.