Granted Patent
Utility
US 6,330,697 · App. 09/294,866
Apparatus and method for performing a defect leakage screen test for memory devices
Inventors:
Michael Patrick Clinton, Klaus Enk, Russell J. Houghton, Alan D. Norris, Josef Schnell
Patented Case
View Patent ↗
Granted: Dec 11, 2001
Filed: Apr 20, 1999
Inventors
Michael Patrick Clinton
Klaus Enk
Russell J. Houghton
Alan D. Norris
Josef Schnell
Assignee (at issue)
International Business Machines Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.