IP Library Granted Patent US 6,337,256
Granted Patent Utility
US 6,337,256 · App. 09/441,206

Impurity ion segregation precluding layer, fabrication method thereof, isolation structure for semiconductor device using the impurity ion segregation precluding layer and fabricating method thereof

Inventor: Hyun-Sook Shim
Patented Case View Patent ↗
Granted: Jan 8, 2002 Filed: Nov 16, 1999
Inventor
Hyun-Sook Shim
Assignee (at issue)
Hyundai Electronics Industries Co. Ltd.

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Quick Facts
Patent No.
US 6,337,256
App. No.
09/441,206
Filed
1999-11-16
Granted
2002-01-08
Kind
B1