Granted Patent
Utility
US 6,346,821 · App. 09/266,039
Method for nondestructive measurement of minority carrier diffusion length and minority carrier lifetime in semiconductor devices
Inventor:
Helmut Baumgart
Patented Case
View Patent ↗
Granted: Feb 12, 2002
Filed: Mar 11, 1999
Inventor
Helmut Baumgart
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.