Granted Patent
Utility
US 6,348,356 · App. 09/664,636
Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors
Inventors:
Sunil N. Shabde, Richard C. Blish, II, Donald L. Wollesen
Patented Case
View Patent ↗
Granted: Feb 19, 2002
Filed: Sep 19, 2000
Inventors
Sunil N. Shabde
Richard C. Blish, II
Donald L. Wollesen
Assignee (at issue)
Advanced Micro Devices, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.