Granted Patent
Utility
US 6,356,490 · App. 09/570,377
Semiconductor device, testing device thereof and testing method thereof
Inventors:
Shoichi Matsuo, Tsuneo Abe
Patented Case
View Patent ↗
Granted: Mar 12, 2002
Filed: May 12, 2000
Inventors
Shoichi Matsuo
Tsuneo Abe
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.