IP Library Granted Patent US 6,366,108
Granted Patent Utility
US 6,366,108 · App. 09/203,295

System and method for detecting defects within an electrical circuit by analyzing quiescent current

Inventors: Peter Mark O'Neill, Victor Johansen, Peter C. Maxwell
Patented Case View Patent ↗
Granted: Apr 2, 2002 Filed: Dec 1, 1998
Inventors
Peter Mark O'Neill
Victor Johansen
Peter C. Maxwell
Assignee (at issue)
Agilent Technologies, Inc.

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Quick Facts
Patent No.
US 6,366,108
App. No.
09/203,295
Filed
1998-12-01
Granted
2002-04-02
Kind
B2