Granted Patent
Utility
US 6,366,109 · App. 09/348,489
Semiconductor device testing system and method
Inventor:
Shigeru Matsushita
Patented Case
View Patent ↗
Granted: Apr 2, 2002
Filed: Jul 7, 1999
Inventor
Shigeru Matsushita
Assignee (at issue)
Advantest Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.