Granted Patent
Utility
US 6,366,111 · App. 09/483,465
Test circuit for semiconductor IC device
Inventor:
Ken Kawai
Patented Case
View Patent ↗
Granted: Apr 2, 2002
Filed: Jan 13, 2000
Inventor
Ken Kawai
Assignee (at issue)
SHARP KABUSHIKI KAISHA
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.