Granted Patent
Utility
US 6,371,640 · App. 09/680,154
Apparatus and method for characterizing libraries of different materials using X-ray scattering
Inventors:
Damian Hajduk, James Bennett, Rakesh Jain
Patented Case
View Patent ↗
Granted: Apr 16, 2002
Filed: Oct 3, 2000
Inventors
Damian Hajduk
James Bennett
Rakesh Jain
Assignee (at issue)
Symyx Technologies, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.