Granted Patent
Utility
US 6,373,764 · App. 09/790,573
Semiconductor memory device allowing static-charge tolerance test between bit lines
Inventor:
Shinya Fujioka
Patented Case
View Patent ↗
Granted: Apr 16, 2002
Filed: Feb 23, 2001
Inventor
Shinya Fujioka
Assignee (at issue)
Fujitsu Limited
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.