Granted Patent
Utility
US 6,377,901 · App. 09/259,866
Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time
Inventors:
Steven K List, David T. Crook
Patented Case
View Patent ↗
Granted: Apr 23, 2002
Filed: Mar 1, 1999
Inventors
Steven K List
David T. Crook
Assignee (at issue)
Agilent Technologies, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.