Granted Patent
Utility
US 6,400,623 · App. 09/781,054
Semiconductor memory having parallel test mode
Inventor:
Kazuki Ohno
Patented Case
View Patent ↗
Granted: Jun 4, 2002
Filed: Feb 8, 2001
Inventor
Kazuki Ohno
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.