Granted Patent
Utility
US 6,401,224 · App. 09/261,100
Integrated circuit and method for testing it
Inventors:
Sabine Schoniger, Peter Schrogmeier, Thomas Hein, Stefan Dietrich
Patented Case
View Patent ↗
Granted: Jun 4, 2002
Filed: Mar 2, 1999
Inventors
Sabine Schoniger
Peter Schrogmeier
Thomas Hein
Stefan Dietrich
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.