IP Library Granted Patent US 6,403,411
Granted Patent Utility
US 6,403,411 · App. 09/208,601

Method for manufacturing lower electrode of DRAM capacitor

Inventors: Chih-Hsun Chu, Horng-Nan Chern, Kevin Lin, Kuo-Tai Huang, Wen-Yi Hsieh, Tri-Rung Yew
Patented Case View Patent ↗
Granted: Jun 11, 2002 Filed: Dec 8, 1998
Inventors
Chih-Hsun Chu
Horng-Nan Chern
Kevin Lin
Kuo-Tai Huang
Wen-Yi Hsieh
Tri-Rung Yew
Assignee (at issue)
WINBOND ELECTRONICS CORP.

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Quick Facts
Patent No.
US 6,403,411
App. No.
09/208,601
Filed
1998-12-08
Granted
2002-06-11
Kind
B1