IP Library › Granted Patent US 6,404,250
Granted Patent Utility
US 6,404,250 · App. 09/819,588

On-chip circuits for high speed memory testing with a slow memory tester

Inventors: Joerg Volrath, Keith White, Mark Daniel Eubanks
Patented Case View Patent ↗
Granted: Jun 11, 2002 Filed: Mar 28, 2001
Inventors
Joerg Volrath
Keith White
Mark Daniel Eubanks
Assignee (at issue)
Infineon Technologies Richmond, LP

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Quick Facts
Patent No.
US 6,404,250
App. No.
09/819,588
Filed
2001-03-28
Granted
2002-06-11
Kind
B1