Granted Patent
Utility
US 6,404,846 · App. 09/531,662
Fluorescent x-ray method for determining x-ray alignment by luminescent changes
Inventors:
Kiyoshi Hasegawa, Yuuya Sone
Patented Case
View Patent ↗
Granted: Jun 11, 2002
Filed: Mar 20, 2000
Inventors
Kiyoshi Hasegawa
Yuuya Sone
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.