Granted Patent
Utility
US 6,407,573 · App. 09/238,887
Device for evaluating characteristic of insulated gate transistor
Inventors:
Kenji Yamaguchi, Hiroyuki Amishiro, Yuko Maruyama
Patented Case
View Patent ↗
Granted: Jun 18, 2002
Filed: Jan 28, 1999
Inventors
Kenji Yamaguchi
Hiroyuki Amishiro
Yuko Maruyama
Assignees (at issue)
MITSUBISHI ELECTRIC CORPORATION
MITSUBISHI ELECTRIC ENGINEERING COMPANY, LIMITED
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.