Granted Patent
Utility
US 6,414,508 · App. 09/557,747
Methods for predicting reliability of semiconductor devices using voltage stressing
Inventor:
Arnie London
Patented Case
View Patent ↗
Granted: Jul 2, 2002
Filed: Apr 25, 2000
Inventor
Arnie London
Assignee (at issue)
Adaptec, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.