Granted Patent
Utility
US 6,415,404 · App. 09/384,950
Method of an apparatus for designing test facile semiconductor integrated circuit
Inventor:
Masao Asou
Patented Case
View Patent ↗
Granted: Jul 2, 2002
Filed: Aug 27, 1999
Inventor
Masao Asou
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.