Granted Patent
Utility
US 6,427,217 · App. 09/292,717
System and method for scan assisted self-test of integrated circuits
Inventor:
Frederick Hartnett
Patented Case
View Patent ↗
Granted: Jul 30, 2002
Filed: Apr 15, 1999
Inventor
Frederick Hartnett
Assignee (at issue)
Agilent Technologies, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.