Granted Patent
Utility
US 6,434,725 · App. 09/603,592
Method and system for semiconductor testing using yield correlation between global and class parameters
Inventors:
Michael Sommer, Larry Broach, Herbert Lammering
Patented Case
View Patent ↗
Granted: Aug 13, 2002
Filed: Jun 26, 2000
Inventors
Michael Sommer
Larry Broach
Herbert Lammering
Assignees (at issue)
Infineon Technologies Richmond, LP
White Oak Semiconductor Partnership
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.