Granted Patent
Utility
US 6,437,585 · App. 09/699,179
Electrical contactor for automatic testing of chips including RF chips
Inventors:
Joseph John Mickey, III, Erik Wayne Demarest
Patented Case
View Patent ↗
Granted: Aug 20, 2002
Filed: Oct 27, 2000
Inventors
Joseph John Mickey, III
Erik Wayne Demarest
Assignee (at issue)
ANADIGICS, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.