IP Library Granted Patent US 6,442,233
Granted Patent Utility
US 6,442,233 · App. 09/637,755

Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection

Inventors: Lee Grodzins, William Adams, Peter J. Rothschild
Patented Case View Patent ↗
Granted: Aug 27, 2002 Filed: Aug 11, 2000
Inventors
Lee Grodzins
William Adams
Peter J. Rothschild
Assignee (at issue)
American Science and Engineering, Inc.

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Quick Facts
Patent No.
US 6,442,233
App. No.
09/637,755
Filed
2000-08-11
Granted
2002-08-27
Kind
B1