IP Library › Granted Patent US 6,442,722
Granted Patent Utility
US 6,442,722 · App. 09/430,686

Method and apparatus for testing circuits with multiple clocks

Inventors: Benoit Nadeau-Dostie, David P. Buck
Patented Case View Patent ↗
Granted: Aug 27, 2002 Filed: Oct 29, 1999
Inventors
Benoit Nadeau-Dostie
David P. Buck
Assignee (at issue)
LogicVision, Inc.

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Quick Facts
Patent No.
US 6,442,722
App. No.
09/430,686
Filed
1999-10-29
Granted
2002-08-27
Kind
B1