Granted Patent
Utility
US 6,445,630 · App. 09/816,924
Method for carrying out a burn-in process for electrically stressing a semiconductor memory
Inventors:
Kamel Ayadi, Jürgen Lindolf, Nedim Oezoguz-Geissler
Patented Case
View Patent ↗
Granted: Sep 3, 2002
Filed: Mar 23, 2001
Inventors
Kamel Ayadi
Jürgen Lindolf
Nedim Oezoguz-Geissler
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.