IP Library › Granted Patent US 6,449,754
Granted Patent Utility
US 6,449,754 · App. 09/534,280

Method of measuring the accuracy of parasitic capacitance extraction

Inventors: Eileen H. You, Weize Xie, John F. MacDonald
Patented Case View Patent ↗
Granted: Sep 10, 2002 Filed: Mar 24, 2000
Inventors
Eileen H. You
Weize Xie
John F. MacDonald
Assignee (at issue)
Sun Microsystems Inc.

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Quick Facts
Patent No.
US 6,449,754
App. No.
09/534,280
Filed
2000-03-24
Granted
2002-09-10
Kind
B1