Granted Patent
Utility
US 6,452,844 · App. 09/739,490
Semiconductor storage device having redundancy circuit for replacement of defect cells under tests
Inventor:
Yasuji Koshikawa
Patented Case
View Patent ↗
Granted: Sep 17, 2002
Filed: Dec 18, 2000
Inventor
Yasuji Koshikawa
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.