Granted Patent
Utility
US 6,453,063 · App. 09/238,435
Automatic focused ion beam imaging system and method
Inventors:
Michael William Phaneuf, Dick James, Julia Elvidge, Pierrette M. Breton, Terry Ludlow, David F. Skoll, Bryan Socransky, Louise Weaver, Ray Haythornthwaite
Patented Case
View Patent ↗
Granted: Sep 17, 2002
Filed: Jan 28, 1999
Inventors
Michael William Phaneuf
Dick James
Julia Elvidge
Pierrette M. Breton
Terry Ludlow
David F. Skoll
Bryan Socransky
Louise Weaver
Ray Haythornthwaite
Assignee (at issue)
CHIPWORKS INCORPORATED
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.