IP Library › Granted Patent US 6,456,741
Granted Patent Utility
US 6,456,741 · App. 09/739,084

Structure-guided image measurement method

Inventors: Shih-Jong J. Lee, Seho Oh
Patented Case View Patent ↗
Granted: Sep 24, 2002 Filed: Dec 15, 2000
Inventors
Shih-Jong J. Lee
Seho Oh

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Quick Facts
Patent No.
US 6,456,741
App. No.
09/739,084
Filed
2000-12-15
Granted
2002-09-24
Kind
B1