Granted Patent
Utility
US 6,459,285 · App. 09/525,766
Burn-in apparatus for screening plurality of semiconductor devices
Inventor:
Fumihiro Okabe
Patented Case
View Patent ↗
Granted: Oct 1, 2002
Filed: Mar 14, 2000
Inventor
Fumihiro Okabe
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.