Granted Patent
Utility
US 6,460,997 · App. 09/566,409
Apparatus and method for objective measurements of optical systems using wavefront analysis
Inventors:
Rudolph W. Frey, James H. Burkhalter, Neil Zepkin, Edward Poppeliers, John Alfred Campin
Patented Case
View Patent ↗
Granted: Oct 8, 2002
Filed: May 8, 2000
Inventors
Rudolph W. Frey
James H. Burkhalter
Neil Zepkin
Edward Poppeliers
John Alfred Campin
Assignee (at issue)
ALCON UNIVERSAL LTD.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.