Granted Patent
Utility
US 6,462,996 · App. 09/943,011
Semiconductor integrated circuit device having internal synchronizing circuit responsive to test mode signal
Inventor:
Tsukasa Ooishi
Patented Case
View Patent ↗
Granted: Oct 8, 2002
Filed: Aug 31, 2001
Inventor
Tsukasa Ooishi
Assignee (at issue)
MITSUBISHI ELECTRIC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.