Granted Patent
Utility
US 6,466,882 · App. 09/377,075
Integrated system for detecting and repairing semiconductor defects and a method for controlling the same
Inventors:
Sin-Seob Kang, Jin Ho Choi
Patented Case
View Patent ↗
Granted: Oct 15, 2002
Filed: Aug 19, 1999
Inventors
Sin-Seob Kang
Jin Ho Choi
Assignee (at issue)
SAMSUNG DISPLAY CO., LTD.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.