Granted Patent
Utility
US 6,473,185 · App. 09/800,994
Alignment free interferometer and alignment free method of profiling object surfaces
Inventors:
Itai Vishnia, Zvi Bleier
Patented Case
View Patent ↗
Granted: Oct 29, 2002
Filed: Mar 7, 2001
Inventors
Itai Vishnia
Zvi Bleier
Assignee (at issue)
PLX, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.