Granted Patent
Utility
US 6,475,912 · App. 09/321,713
Semiconductor device and method and apparatus for fabricating the same while minimizing operating failures and optimizing yield
Inventor:
Takeshi Harada
Patented Case
View Patent ↗
Granted: Nov 5, 2002
Filed: May 28, 1999
Inventor
Takeshi Harada
Assignee (at issue)
SUMITOMO ELECTRIC INDUSTRIES, LTD.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.