Granted Patent
Utility
US 6,477,095 · App. 09/751,555
Method for reading semiconductor die information in a parallel test and burn-in system
Inventors:
Keith White, Mark Daniel Eubanks
Patented Case
View Patent ↗
Granted: Nov 5, 2002
Filed: Dec 28, 2000
Inventors
Keith White
Mark Daniel Eubanks
Assignee (at issue)
Infineon Technologies Richmond, LP
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.