Granted Patent
Utility
US 6,477,684 · App. 09/611,734
Automatic test pattern generation modeling for LSSD to interface with Muxscan
Inventor:
Amit Sanghani
Patented Case
View Patent ↗
Granted: Nov 5, 2002
Filed: Jul 7, 2000
Inventor
Amit Sanghani
Assignee (at issue)
Sun Microsystems Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.