Granted Patent
Utility
US 6,480,019 · App. 09/829,130
Multiple voted logic cell testable by a scan chain and system and method of testing the same
Inventors:
Arthur Howard Waldie, Robert Ward James, Kuo-Chuan Chang
Patented Case
View Patent ↗
Granted: Nov 12, 2002
Filed: Apr 9, 2001
Inventors
Arthur Howard Waldie
Robert Ward James
Kuo-Chuan Chang
Assignee (at issue)
GOODRICH CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.