IP Library Granted Patent US 6,480,978
Granted Patent Utility
US 6,480,978 · App. 09/260,459

Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons

Inventors: Richard S. Roy, Charles A. Miller
Patented Case View Patent ↗
Granted: Nov 12, 2002 Filed: Mar 1, 1999
Inventors
Richard S. Roy
Charles A. Miller
Assignee (at issue)
FormFactor, Inc.

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Quick Facts
Patent No.
US 6,480,978
App. No.
09/260,459
Filed
1999-03-01
Granted
2002-11-12
Kind
B1