Granted Patent
Utility
US 6,483,328 · App. 09/204,740
Probe card for probing wafers with raised contact elements
Inventors:
Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu
Patented Case
View Patent ↗
Granted: Nov 19, 2002
Filed: Dec 2, 1998
Inventors
Benjamin N. Eldridge
Gary W. Grube
Gaetan L. Mathieu
Assignee (at issue)
FormFactor, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.