IP Library Granted Patent US 6,489,784
Granted Patent Utility
US 6,489,784 · App. 09/825,498

Method and apparatus for measuring parameters of material

Inventors: Brian T. Adams, Thomas Karlmann, George H. Hale, William L. Schubert
Patented Case View Patent ↗
Granted: Dec 3, 2002 Filed: Apr 3, 2001
Inventors
Brian T. Adams
Thomas Karlmann
George H. Hale
William L. Schubert
Assignee (at issue)
Case GmbH

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Quick Facts
Patent No.
US 6,489,784
App. No.
09/825,498
Filed
2001-04-03
Granted
2002-12-03
Kind
B2