Granted Patent
Utility
US 6,490,198 · App. 09/922,791
Test methods for semiconductor non-volatile memories
Inventor:
Satoshi Yoshimura
Patented Case
View Patent ↗
Granted: Dec 3, 2002
Filed: Aug 7, 2001
Inventor
Satoshi Yoshimura
Assignee (at issue)
SHARP KABUSHIKI KAISHA
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.